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The Effect of GeO2 and In2O3 Doping on the Dielectric Properties of CaCu3Ti4O12 Ceramics Prepared via Vibro-Milling Method

Identifieur interne : 002351 ( Main/Repository ); précédent : 002350; suivant : 002352

The Effect of GeO2 and In2O3 Doping on the Dielectric Properties of CaCu3Ti4O12 Ceramics Prepared via Vibro-Milling Method

Auteurs : RBID : Pascal:11-0391203

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English descriptors

Abstract

In this work, effects of GeO2 and In2O3 doping on the dielectric properties of CCTO were investigated. Doping levels range from 0.5 to 2.0 mol%. The vibro-milling method was employed for processing. The dopant addition produced a slightly smaller grain size. A reduction in dielectric constant was observed, but it is still high. The 2.0 mol% GeO2 and In2O3 doped samples exhibited high dielectric constant of about 25,000 and 23,000 and low dielectric loss with 0.06 and 0.05 respectively at room temperature and at 10 kHz. The dielectric measurements showed that the modified samples exhibited a strong dielectric independency of temperature and frequency. In addition, the loss tangent reduced after doping. From this results, it can be incurred that GeO2 and In2O3 doping, processed via vibro-mill are the suitable methods to achieve the stability of high εr and low loss ceramics.

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Pascal:11-0391203

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<title xml:lang="en" level="a">The Effect of GeO2 and In2O3 Doping on the Dielectric Properties of CaCu3Ti4O12 Ceramics Prepared via Vibro-Milling Method</title>
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<name sortKey="Makcharoen, Worawut" uniqKey="Makcharoen W">Worawut Makcharoen</name>
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<s1>Department of Physics, Faculty of Science, Chiang Mai University</s1>
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<name sortKey="Tontrakoon, Jerapong" uniqKey="Tontrakoon J">Jerapong Tontrakoon</name>
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<s1>Department of Physics, Faculty of Science, Chiang Mai University</s1>
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<name sortKey="Rujijanagul, Gobwute" uniqKey="Rujijanagul G">Gobwute Rujijanagul</name>
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<s1>Department of Physics, Faculty of Science, Chiang Mai University</s1>
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<wicri:noRegion>Materials Science Research Center, Chiang Mai University</wicri:noRegion>
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<name sortKey="Cann, David P" uniqKey="Cann D">David P. Cann</name>
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<s1>Faculty of Materials Science, Department of Mechanical Engineering, Oregon State Univeristy</s1>
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<country>États-Unis</country>
<wicri:noRegion>Corvallis, Oregon</wicri:noRegion>
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<author>
<name sortKey="Tunkasiri, Tawee" uniqKey="Tunkasiri T">Tawee Tunkasiri</name>
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<s1>School of Science, Mae Fah Lung University</s1>
<s2>Chiang Rai 57100</s2>
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<country>Thaïlande</country>
<wicri:noRegion>Chiang Rai 57100</wicri:noRegion>
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<title level="j" type="abbreviated">Ferroelectrics : (Print)</title>
<title level="j" type="main">Ferroelectrics : (Print)</title>
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<term>Calcium Copper Titanates Mixed</term>
<term>Dielectric losses</term>
<term>Dielectric materials</term>
<term>Dielectric properties</term>
<term>Doping</term>
<term>Germanium additions</term>
<term>Grain size</term>
<term>High k dielectric</term>
<term>Impurity density</term>
<term>Indium additions</term>
<term>Microstructure</term>
<term>Permittivity</term>
<term>Vibratory mill</term>
</keywords>
<keywords scheme="Pascal" xml:lang="fr">
<term>Dopage</term>
<term>Propriété diélectrique</term>
<term>Broyeur vibrant</term>
<term>Addition germanium</term>
<term>Grosseur grain</term>
<term>Constante diélectrique</term>
<term>Perte diélectrique</term>
<term>Microstructure</term>
<term>Addition indium</term>
<term>Concentration impureté</term>
<term>Calcium Cuivre Titanate Mixte</term>
<term>Diélectrique permittivité élevée</term>
<term>Matériau diélectrique</term>
<term>CaCu3Ti4O12</term>
</keywords>
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<term>Dopage</term>
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<front>
<div type="abstract" xml:lang="en">In this work, effects of GeO
<sub>2</sub>
and In
<sub>2</sub>
O
<sub>3</sub>
doping on the dielectric properties of CCTO were investigated. Doping levels range from 0.5 to 2.0 mol%. The vibro-milling method was employed for processing. The dopant addition produced a slightly smaller grain size. A reduction in dielectric constant was observed, but it is still high. The 2.0 mol% GeO
<sub>2</sub>
and In
<sub>2</sub>
O
<sub>3</sub>
doped samples exhibited high dielectric constant of about 25,000 and 23,000 and low dielectric loss with 0.06 and 0.05 respectively at room temperature and at 10 kHz. The dielectric measurements showed that the modified samples exhibited a strong dielectric independency of temperature and frequency. In addition, the loss tangent reduced after doping. From this results, it can be incurred that GeO
<sub>2</sub>
and In
<sub>2</sub>
O
<sub>3</sub>
doping, processed via vibro-mill are the suitable methods to achieve the stability of high ε
<sub>r</sub>
and low loss ceramics.</div>
</front>
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<s1>The Effect of GeO2 and In2O3 Doping on the Dielectric Properties of CaCu3Ti4O12 Ceramics Prepared via Vibro-Milling Method</s1>
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<s1>© 2011 INIST-CNRS. All rights reserved.</s1>
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<s0>19 ref.</s0>
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<s0>11-0391203</s0>
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<fA60>
<s1>P</s1>
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<fA61>
<s0>A</s0>
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<s0>Ferroelectrics : (Print)</s0>
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<s0>GBR</s0>
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<fC01 i1="01" l="ENG">
<s0>In this work, effects of GeO
<sub>2</sub>
and In
<sub>2</sub>
O
<sub>3</sub>
doping on the dielectric properties of CCTO were investigated. Doping levels range from 0.5 to 2.0 mol%. The vibro-milling method was employed for processing. The dopant addition produced a slightly smaller grain size. A reduction in dielectric constant was observed, but it is still high. The 2.0 mol% GeO
<sub>2</sub>
and In
<sub>2</sub>
O
<sub>3</sub>
doped samples exhibited high dielectric constant of about 25,000 and 23,000 and low dielectric loss with 0.06 and 0.05 respectively at room temperature and at 10 kHz. The dielectric measurements showed that the modified samples exhibited a strong dielectric independency of temperature and frequency. In addition, the loss tangent reduced after doping. From this results, it can be incurred that GeO
<sub>2</sub>
and In
<sub>2</sub>
O
<sub>3</sub>
doping, processed via vibro-mill are the suitable methods to achieve the stability of high ε
<sub>r</sub>
and low loss ceramics.</s0>
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<s0>001B70G22C</s0>
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<fC02 i1="02" i2="3">
<s0>001B70G22G</s0>
</fC02>
<fC03 i1="01" i2="X" l="FRE">
<s0>Dopage</s0>
<s5>02</s5>
</fC03>
<fC03 i1="01" i2="X" l="ENG">
<s0>Doping</s0>
<s5>02</s5>
</fC03>
<fC03 i1="01" i2="X" l="SPA">
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<s5>02</s5>
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<s5>03</s5>
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<s0>Dielectric properties</s0>
<s5>03</s5>
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<s5>04</s5>
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<s5>04</s5>
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<s0>Molino vibrante</s0>
<s5>04</s5>
</fC03>
<fC03 i1="04" i2="3" l="FRE">
<s0>Addition germanium</s0>
<s5>05</s5>
</fC03>
<fC03 i1="04" i2="3" l="ENG">
<s0>Germanium additions</s0>
<s5>05</s5>
</fC03>
<fC03 i1="05" i2="3" l="FRE">
<s0>Grosseur grain</s0>
<s5>06</s5>
</fC03>
<fC03 i1="05" i2="3" l="ENG">
<s0>Grain size</s0>
<s5>06</s5>
</fC03>
<fC03 i1="06" i2="3" l="FRE">
<s0>Constante diélectrique</s0>
<s5>07</s5>
</fC03>
<fC03 i1="06" i2="3" l="ENG">
<s0>Permittivity</s0>
<s5>07</s5>
</fC03>
<fC03 i1="07" i2="3" l="FRE">
<s0>Perte diélectrique</s0>
<s5>08</s5>
</fC03>
<fC03 i1="07" i2="3" l="ENG">
<s0>Dielectric losses</s0>
<s5>08</s5>
</fC03>
<fC03 i1="08" i2="3" l="FRE">
<s0>Microstructure</s0>
<s5>09</s5>
</fC03>
<fC03 i1="08" i2="3" l="ENG">
<s0>Microstructure</s0>
<s5>09</s5>
</fC03>
<fC03 i1="09" i2="3" l="FRE">
<s0>Addition indium</s0>
<s5>10</s5>
</fC03>
<fC03 i1="09" i2="3" l="ENG">
<s0>Indium additions</s0>
<s5>10</s5>
</fC03>
<fC03 i1="10" i2="X" l="FRE">
<s0>Concentration impureté</s0>
<s5>11</s5>
</fC03>
<fC03 i1="10" i2="X" l="ENG">
<s0>Impurity density</s0>
<s5>11</s5>
</fC03>
<fC03 i1="10" i2="X" l="SPA">
<s0>Concentración impureza</s0>
<s5>11</s5>
</fC03>
<fC03 i1="11" i2="X" l="FRE">
<s0>Calcium Cuivre Titanate Mixte</s0>
<s2>NC</s2>
<s2>NA</s2>
<s5>17</s5>
</fC03>
<fC03 i1="11" i2="X" l="ENG">
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<s2>NA</s2>
<s5>17</s5>
</fC03>
<fC03 i1="11" i2="X" l="SPA">
<s0>Mixto</s0>
<s2>NC</s2>
<s2>NA</s2>
<s5>17</s5>
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<fC03 i1="12" i2="X" l="FRE">
<s0>Diélectrique permittivité élevée</s0>
<s5>18</s5>
</fC03>
<fC03 i1="12" i2="X" l="ENG">
<s0>High k dielectric</s0>
<s5>18</s5>
</fC03>
<fC03 i1="12" i2="X" l="SPA">
<s0>Dieléctrico alta constante dieléctrica</s0>
<s5>18</s5>
</fC03>
<fC03 i1="13" i2="3" l="FRE">
<s0>Matériau diélectrique</s0>
<s5>19</s5>
</fC03>
<fC03 i1="13" i2="3" l="ENG">
<s0>Dielectric materials</s0>
<s5>19</s5>
</fC03>
<fC03 i1="14" i2="3" l="FRE">
<s0>CaCu3Ti4O12</s0>
<s4>INC</s4>
<s5>54</s5>
</fC03>
<fN21>
<s1>269</s1>
</fN21>
</pA>
<pR>
<fA30 i1="01" i2="1" l="ENG">
<s1>RCBJSF-10 Russian-cis-Baltic-Japanese Symposium on Ferroelectricity</s1>
<s3>Yokohama JPN</s3>
<s4>2010-06-20</s4>
</fA30>
</pR>
</standard>
</inist>
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